Granular Hall sensors for scanning probe microscopy

  • Scanning Hall probe microscopy is attractive for minimally invasive characterization of magnetic thin films and nanostructures by measurement of the emanating magnetic stray field. Established sensor probes operating at room temperature employ highly miniaturized spin-valve elements or semimetals, such as Bi. As the sensor layer structures are fabricated by patterning of planar thin films, their adaption to custom-made sensor probe geometries is highly challenging or impossible. Here we show how nanogranular ferromagnetic Hall devices fabricated by the direct-write method of focused electron beam induced deposition (FEBID) can be tailor-made for any given probe geometry. Furthermore, we demonstrate how the magnetic stray field sensitivity can be optimized in situ directly after direct-write nanofabrication of the sensor element. First proof-of-principle results on the use of this novel scanning Hall sensor are shown.

Download full text files

Export metadata

Additional Services

Share in Twitter Search Google Scholar
Author:Roland Sachser, Johanna Hütner, Christian H. Schwalb, Michael HuthORCiDGND
Parent Title (English):Nanomaterials
Place of publication:Basel
Document Type:Article
Date of Publication (online):2021/02/01
Date of first Publication:2021/02/01
Publishing Institution:Universitätsbibliothek Johann Christian Senckenberg
Release Date:2021/02/04
Tag:focused electron beam induced deposition; granular ferromagnets; scanning Hall probe microscopy
Issue:Article 348
Page Number:13
Institutes:Physik / Physik
Dewey Decimal Classification:5 Naturwissenschaften und Mathematik / 53 Physik / 530 Physik
Licence (German):License LogoCreative Commons - Namensnennung 4.0