Surface excitations in the modelling of electron transport for electron-beam-induced deposition experiments

  • The aim of the present overview article is to raise awareness of an essential aspect that is usually not accounted for in the modelling of electron transport for focused-electron-beam-induced deposition (FEBID) of nanostructures: Surface excitations are on the one hand responsible for a sizeable fraction of the intensity in reflection-electron-energy-loss spectra for primary electron energies of up to a few kiloelectronvolts and, on the other hand, they play a key role in the emission of secondary electrons from solids, regardless of the primary energy. In this overview work we present a general perspective of recent works on the subject of surface excitations and on low-energy electron transport, highlighting the most relevant aspects for the modelling of electron transport in FEBID simulations.

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Metadaten
Author:Francesc Salvat-PujolORCiD, Roser ValentíORCiDGND, Wolfgang S. M. WernerORCiDGND
URN:urn:nbn:de:hebis:30:3-824128
DOI:https://doi.org/10.3762/bjnano.6.129
ISSN:2190-4286
ArXiv Id:http://arxiv.org/abs/1505.00938
Parent Title (English):Beilstein journal of nanotechnology
Publisher:Beilstein-Institut zur Förderung der Chemischen Wissenschaften
Place of publication:Frankfurt am Main
Document Type:Article
Language:English
Date of Publication (online):2015/06/03
Date of first Publication:2015/06/03
Publishing Institution:Universitätsbibliothek Johann Christian Senckenberg
Release Date:2024/02/19
Tag:focused-electron-beam-induced deposition (FEBID); Monte Carlo simulation of electron transport; surface excitations; secondary-electron emission
Volume:6
Page Number:8
First Page:1260
Last Page:1267
HeBIS-PPN:520902386
Institutes:Physik / Physik
Dewey Decimal Classification:5 Naturwissenschaften und Mathematik / 53 Physik / 530 Physik
Sammlungen:Universitätspublikationen
Licence (German):License LogoCreative Commons - Namensnennung 2.0