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Physical properties of single-crystalline Ba 8 Ni 3.5 Ge 42.1 h 0.4

  • Clathrates are candidate materials for thermoelectric applications because of a number of unique properties. The clathrate I phases in the Ba-Ni-Ge ternary system allow controlled variation of the charge carrier concentration by adjusting the Ni content. Depending on the Ni content, the physical properties vary from metal-like to insulator-like and show a transition from p-type to n-type conduction. Here we present first results on the characterization of millimeter-sized single crystals grown by the Bridgman technique. Single crystals with a composition of Ba8Ni3.5Ge42.1h0.4 show metallic behavior (dp/dT > 0) albeit with high resistivity at room temperature [p (300 K) = 1 mOhm cm]. The charge carrier concentration at 300 K, as determined from Hall-effect measurements, is 2.3 e-/unit cell. The dimensionless thermoelectric figure of merit estimated at 680 K is ZT ~ 0.2. Keywords Clathrates - thermoelectric material - intermetallic compound - nickel

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Author:Lien Thi Kim Nguyen, Umut Aydemir, Michael Baitinger, Jeroen Custers, Amir-Abbas HaghighiradORCiDGND, Rudolf Höfler, Klaus-Dieter Luther, Franz Ritter, Yuri Grin, Wolf AßmusGND, Silke Paschen
URN:urn:nbn:de:hebis:30-72063
DOI:https://doi.org/10.1007/s11664-010-1312-3
ISSN:1543-186X
ISSN:0361-5235
Parent Title (English):Journal of electronic materials
Publisher:TMS
Place of publication:Warrendale, Pa
Document Type:Article
Language:English
Year of Completion:2010
Date of first Publication:2010/08/19
Publishing Institution:Universitätsbibliothek Johann Christian Senckenberg
Release Date:2010/09/07
Tag:clathrates; intermetallic compound; nickel; thermoelectric material
Volume:39
Issue:9
Page Number:4
First Page:1386
Last Page:1389
Note:
Open Access: This article is distributed under the terms of the Creative Commons Attribution Noncommercial License which permits any noncommercial use, distribution, and reproduction in any medium, provided the original author(s) and source are credited.
Source:Journal of Electronic Materials, Vol. 39, No. 9, S. 1386-1389, DOI: 10.1007/s11664-010-1312-3 ; http://www.springerlink.com/content/y463763g34766472/fulltext.pdf
HeBIS-PPN:226651827
Institutes:Physik / Physik
Dewey Decimal Classification:5 Naturwissenschaften und Mathematik / 53 Physik / 530 Physik
Sammlungen:Universitätspublikationen
Licence (English):License LogoCreative Commons - Namensnennung-Nicht kommerziell 4.0